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Calibration of Vector Network Analyzer for Measurements in Radio Frequency Propagation Channels
Published on: June 2, 2020
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High-accuracy optical vector network analyzer for optical notch and bandpass responses.
Applied Optics
|June 10, 2024
Summary
A novel optical vector network analyzer (OVNA) using carrier-suppressed double sideband modulation enhances measurement accuracy and simplifies testing. This method improves precision by eliminating even-order sideband errors, offering a stable solution for photonic systems.
Area of Science:
- Photonics and Optical Engineering
- Measurement Science and Instrumentation
Background:
- Traditional optical vector network analyzers (OVNA) face limitations in accuracy and measurement range.
- Existing methods struggle with even-order sideband errors and complex postprocessing.
Purpose of the Study:
- To propose and demonstrate a high-accuracy OVNA using carrier-suppressed double sideband (CS-DSB) modulation.
- To overcome limitations of conventional OVNA techniques, including band-pass response measurement and optical filter immunity.
Main Methods:
- Generation of ±1st-order sideband signals via CS-DSB modulation.
- Utilizing the Pound-Drever-Hall (PDH) technique for optical carrier alignment.
- Detection and processing of double the radio frequency (RF) signal for band-stop/band-pass response determination.
Main Results:
- Demonstrated improved measurement accuracy by eliminating even-order sideband errors.
- Achieved single-step measurement, reducing complexity and avoiding postprocessing.
- Successfully measured band-stop responses (6 GHz range, 1.2 MHz resolution) and band-pass responses (0-13 GHz range) of a Fabry-Perot interferometer.
- Exhibited optical filter immunity for accurate near-carrier measurements.
Conclusions:
- The proposed CS-DSB based OVNA offers enhanced accuracy, stability, and simplified operation.
- This technique overcomes limitations of traditional OVNA, enabling precise measurements for diverse photonic applications.
- The method provides a robust and efficient tool for characterizing optical devices.
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