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Updated: Jun 24, 2025

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
A Practical Approach for Determination of Thermal Stress and Temperature-Dependent Material Properties in
Yanqiao Yang1, Andreas Winkler1, Atefeh Karimzadeh1
1Leibniz IFW Dresden, SAWLab Saxony, Institute for Emerging Electronic Technologies (IET), Group "Acoustic Microsystems", Helmholtzstr. 20, 01069 Dresden, Germany.
Abstract:
Multilayered thin films are essential to most microelectro-mechanical systems (MEMSs). The reliability and predictability of the behavior of such systems, especially when intended for usage at high temperatures or in harsh environments, demand the consideration of thermo-mechanical properties of the individual films of the multilayer arrangement during the design stage. This paper introduces a newly derived analytical model for the convenient indirect determination of the temperature-dependent Young's modulus and the thermally induced stress of individual layers within a multilayered thin film system, i.e., a multilayer-adapted Stoney equation. It is based on sample curvature measurement and requires data from only a single experiment. Experimental and numerical investigations of the new models are carried out using a five-layered sample of a RuAl metallization system developed for wireless high-temperature acoustic sensing. The results highlight the usability of the new model in practical MEMS analysis, enabling insights into complex layer stacks by overcoming current experimental limitations.
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