Spectrophotometry: Introduction
UV–Vis Spectrometers
IR Spectrometers
IR Frequency Region: Fingerprint Region
Raman Spectroscopy Instrumentation: Overview
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
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Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
This study introduces a new tolerance analysis for freeform Schwarzschild imaging spectrometers. The method precisely controls mirror alignment, enabling successful prototype development and validating the approach with measured results.
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