Integration of a Randomized Sequence Scanning Approach in AlphaFold2 and Local Frustration Profiling of

Nishank Raisinghani1, Mohammed Alshahrani1, Grace Gupta1

  • 1Keck Center for Science and Engineering, Graduate Program in Computational and Data Sciences, Schmid College of Science and Technology, Chapman University, Orange, California 92866, United States.