A machine learning artefact detection method for single-channel infant event-related potential studies

Simon Marchant1, Marianne van der Vaart1, Kirubin Pillay1

  • 1Department of Paediatrics, University of Oxford, Oxford, United Kingdom.

PubMed
Summary

This study developed an automated method to detect artefacts in single-channel electroencephalographic (EEG) data from neonates. The new approach matches manual review accuracy, improving infant EEG analysis for research and clinical use.