Related Experiment Videos
Light microscopic depth measurements of thick sections.
Journal of Neuroscience Methods
|July 1, 1985
Summary
Measuring histological section thickness is simple using a microscope
Area of Science:
- Histology
- Microscopy
- Optical Measurement
Background:
- Accurate measurement of histological section thickness is crucial for quantitative analysis.
- Traditional methods can be time-consuming and prone to error.
Purpose of the Study:
- To present a straightforward method for measuring the thickness of histological sections using a compound light microscope.
- To outline necessary corrections and precautions for accurate measurements.
Main Methods:
- Utilizing the fine focus knob of a compound light microscope to determine depth.
- Applying a correction factor of 1.5 for the refractive index when using a dry objective.
- Implementing a calibration correction for the fine focus knob itself.
Main Results:
- Differences in fine focus knob settings directly correlate with specimen thickness.
- Two key corrections (refractive index and fine focus calibration) are essential for accuracy.
- Adherence to specific precautions minimizes measurement errors.
Conclusions:
- Microscope fine focus knob readings offer a practical method for measuring histological section thickness.
- Applying refractive index and calibration corrections enhances measurement precision.
- This technique provides a reliable approach for determining specimen depth in histology.