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A Surface Acoustic Wave-Based PM 1.0 Fine Dust Detection System Using Full Digital Time-Interleaved Counters
Chang-Hyeon Kim1, Ki-Hoon Yang1, Yeon-Seob Song1
1Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
Sensors (Basel, Switzerland)
|July 13, 2024
Summary
This study introduces a novel fine dust detection system utilizing surface acoustic wave (SAW) sensors and time-interleaved counters. The system accurately measures frequency differences to detect airborne particulate matter with high resolution.
Area of Science:
- Sensor Technology
- Environmental Monitoring
- Integrated Circuits
Background:
- Surface Acoustic Wave (SAW) sensors are sensitive to mass loading, exhibiting changes in resonance frequency upon exposure to particulate matter.
- Accurate detection of fine dust is crucial for environmental monitoring and public health.
- Existing detection methods may lack the sensitivity or real-time capabilities required for comprehensive monitoring.
Purpose of the Study:
- To propose and validate a fine dust detection system employing SAW sensors and time-interleaved counters.
- To achieve high-resolution frequency measurements for sensitive fine dust detection.
- To demonstrate the feasibility of integrating this system into a standard CMOS process.
Main Methods:
- Utilized SAW sensors whose resonance frequency shifts upon fine dust adhesion.
- Implemented a dual-channel system with sensing and reference SAW oscillators.
- Employed 20-bit asynchronous counters to convert oscillation frequencies to digital data.
- Calculated frequency difference between channels to quantify fine dust presence.
Main Results:
- Achieved a frequency resolution of 0.95 ppm at an operating frequency of 460 MHz.
- Demonstrated the system's capability to detect the presence of fine dust by measuring frequency shifts.
- Successfully implemented the proposed circuit in a TSMC 130 nm CMOS process.
Conclusions:
- The proposed fine dust detection system effectively utilizes SAW sensor frequency shifts and time-interleaved counters for accurate detection.
- The system offers high resolution and is suitable for integration into standard semiconductor manufacturing processes.
- This technology holds promise for advanced environmental monitoring and air quality assessment.

