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Mean Differential Continuous Pulse Method for Accurate Optical Measurements of Light-Emitting Diodes and Laser Diodes
Yuqin Zong1, Jeff Hulett2, Naomasa Koide3
1Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Abstract:
Limited sources exist for the application of germicidal ultraviolet (GUV) radiation. Ultraviolet light-emitting diodes (UV-LEDs) have significantly improved in efficiency and are becoming another viable source for GUV. We have developed a mean differential continuous pulse method (M-DCP method) for optical measurements of light-emitting diodes (LEDs) and laser diodes (LDs). The new M-DCP method provides an improvement on measurement uncertainty by one order of magnitude compared to the unpublished differential continuous pulse method (DCP method). The DCP method was already a significant improvement of the continuous pulse method (CP method) commonly used in the LED industry. The new M-DCP method also makes it possible to measure UV-LEDs with high accuracy. Here, we present the DCP method, discuss the potential systematic error sources in it, and present the M-DCP method along with its reduced systematic errors. This paper also presents the results of validation measurement of LEDs using the M-DCP method and common test instruments.

