Cryo-electron Microscopy
Preparation of Samples for Electron Microscopy
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Updated: Jun 20, 2025

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Abinash Kumar1, Elizaveta Tiukalova1, Kartik Venkatraman1
1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37830, USA.
Precise temperature calibration for cryogenic electron microscopy is essential for studying materials at low temperatures. This study introduces a straightforward electron energy loss spectroscopy method using aluminum plasmons to accurately measure local specimen temperatures.
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