Soft x-ray high diffraction efficiency and spectral flux laminar-type W/B4C multilayer diffraction grating for
M Koike1,2,3, T Hatano2, A S Pirozhkov1
1Kansai Institute for Photon Science (KPSI), National Institutes for Quantum Science and Technology (QST), Kizugawa, Kyoto 619-0215, Japan.
The Review of Scientific Instruments
|July 23, 2024
Summary
New multilayer diffraction gratings significantly enhance soft x-ray spectrograph sensitivity for detecting elements like iron, copper, and zinc. These improved gratings offer 3.2-8.2 times higher spectral flux without compromising spectral resolution.
Area of Science:
- X-ray optics and spectroscopy
- Materials science for advanced coatings
- Instrument development for scientific research
Background:
- Soft x-ray spectroscopy is crucial for analyzing elemental emissions, particularly Fe-L, Cu-L, and Zn-L.
- Existing flat-field spectrographs face limitations in detection limit and sensitivity.
- Improving spectral flux is key to enhancing detection sensitivity in spectrographic instruments.
Purpose of the Study:
- To design multilayer diffraction gratings for soft x-ray flat-field spectrographs.
- To enhance the detection limit and sensitivity for specific soft x-ray emissions (300-1000 eV).
- To increase spectral flux while maintaining spectral resolution and dispersion.
Main Methods:
- Utilized a super-mirror-type W/B4C multilayer coating with graded refractive index and period length.
- Optimized incidence angle to 86.03° and increased groove density to 3200 lines/mm.
- Designed a holographic varied-line-spacing spherical grating using aspherical-wavefront-recording method.
Main Results:
- Numerical simulations demonstrated a 3.2-8.2 times increase in spectral flux.
- The new design maintained spectral resolution comparable to previous designs.
- Enhanced diffraction efficiency across a wide energy range was achieved.
Conclusions:
- The developed W/B4C multilayer gratings significantly improve soft x-ray spectrograph performance.
- The design advancements enable more sensitive detection of key elemental emissions.
- This work contributes to advancements in soft x-ray spectroscopy instrumentation.


