Correcting directional dark field x-ray imaging artefacts using position dependent image deblurring and attenuation...

Area of Science:

• X-ray imaging
• Materials science
• Microscopy

Background:

• X-ray dark-field imaging reveals sample microstructure, complementing bright-field methods.
• Current dark-field retrieval is hindered by non-dark-field blur and phase contrast artifacts.

Purpose of the Study:

• To develop and present corrections for non-dark-field blur and phase contrast artifacts in x-ray dark-field imaging.
• To improve the quality and quantitative accuracy of retrieved dark-field images.

Main Methods:

• Measured and removed non-dark-field blurring (e.g., source-size blur, detector PSF) from experimental images.
• Removed artifacts from attenuation and propagation-based phase contrast.
• Utilized single-grid directional dark-field imaging at a synchrotron source.

Main Results:

• Successfully retrieved directional dark-field images with significantly fewer artifacts.
• Demonstrated more consistent and reliable quantitative measurements from the corrected images.
• Provided comparative "before and after" images showcasing the improvements.

Conclusions:

• The developed correction techniques enhance the quality of x-ray dark-field imaging.
• These corrections lead to more accurate microstructural analysis.
• The methods show potential for broad application across various x-ray imaging techniques.