Development of an Ion Mobility Spectrometer Based on a Pulsed Photoelectric Effect Ionization Source

Ion mobility spectrometry (IMS) is a compact and sensitive trace gas analysis instrument that ionizes the sample into ions for detection. Typically, an ion gate is used to cut the continuous ion beam into ion packets for separation and detection. However, commonly used ion gates suffer from complex structures or low ion transmission rates, making the gateless IMS a viable alternative. In this study, an IMS based on a pulsed photoelectric effect ionization source was designed. The photoelectrons were generated by irradiating a photoelectric material with a back-illuminated pulsed xenon lamp. This allows for low-energy photoelectron generation and the production of simple reactant ions (O₂^-(H₂O)) and thus negative product ions. The photoelectron current generated by this ionization source was analyzed, which can reach an intensity of a few microamperes and can be converted into an ion signal exceeding 10 nA. The introduction of the pulsed photoelectric effect ionization source makes it possible to generate separate ion packets and complete ion injection when a constant electric field is maintained in the ionization region. And with an assisted pulsed electric field in the ionization region, the resolving power of the system can be effectively improved to 1.85 times that of the constant electric field. The IMS developed in this study was used for the detection of common volatile hazardous chemicals, yielding effective results. The detection limit for phenol was below 1 ppb, and the dynamic response range exceeded 1 order of magnitude, which implies the potential applications of this IMS to detect substances with high electron affinity, such as explosives detection in public safety.