Related Experiment Video
Updated: Jun 17, 2025

Author Spotlight: Advancing Energy Solutions Using Nanocomposites as Processed Thermoelectric Materials
Published on: May 17, 2024
Modification in electrical conductivity correlated with surface, structural & optical characteristics of graphite
Shazia Bashir1, Shahbaz Ahmad2, Nisar Ali3
1Department of Physics, Govt. College University, Lahore, 54000, Pakistan.
Abstract:
Ion implantation of laser induced graphite plasma has been performed for modifications in surface, optical, electrical and structural properties of CR-39. KrF Excimer laser (248 nm, 18 ns, 120 mJ), at an irradiance of 2.5 × 108 W cm-2 is utilized for the production of graphite plasma. The energy and fluence of graphite ions are estimated by Thomson parabola technique. The targets are implanted with energy of 710 KeV graphite ions for four fluences ranging from 26 × 1012 to 92 × 1015 ions/cm2, in presence of magnetic field of strength 90 mT. The digital optical analysis reveals well-arranged dendritic and island like structure formation on irradiated polymer surface. Confocal microscopic investigation illustrates the growth of nano/micro sized craters and hillocks for various ion fluences. Dissociation of bonds along with formation of new bonds is confirmed from Raman analysis. UV-Vis spectral analysis reveals that the optical transmittance values for visible regions of CR-39 are drastically reduced from 90 % to 68 % for maximum laser fluence of 92 × 1015 ions.cm-2. Significant improvement in electrical conductivity is achieved from 10-9 to 10-7 Scm-1 for lowest fluence value of graphite ions. SRIM software is utilized for the measurement of stopping power or Linear Energy Transfer (LTE) of 710 Kev graphite ions, is about, 55.53 eV/Ǻ, in the CR-39 targets.
More Related Videos
08:43Effect of Bending on the Electrical Characteristics of Flexible Organic Single Crystal-based Field-effect Transistors
Published on: November 7, 2016
08:12Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015