Point and line defects in checkerboard patterned hybrid nematic films: A computer simulation investigation

Area of Science:

• Physics
• Materials Science

Background:

• Nematic liquid crystals exhibit complex defect structures.
• Surface anchoring conditions significantly influence defect formation in confined liquid crystal films.

Purpose of the Study:

• To investigate the stabilization of line and point defects in a nematic liquid crystal film.
• To explore the impact of patterned hybrid anchoring on defect formation.

Main Methods:

• Monte Carlo simulations were employed to model the liquid crystal film.
• The simulation setup included a flat cell with homeotropic and patterned planar hybrid anchoring.

Main Results:

• Line defects were observed for small domain sizes.
• Point defects emerged when domain size exceeded sample thickness.
• Random surface anchoring in larger domains suppressed line defects, showing connected lines and points.

Conclusions:

• The system can stabilize both line and point defects based on geometric and anchoring conditions.
• Domain size and the nature of planar anchoring (random vs. homogeneous) are critical factors in defect type.
• Anchoring strength influences the position of defect lines relative to the surface.