A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays.

Area of Science:

• Aerospace Engineering
• Computer Architecture
• Reliability Engineering

Background:

• Aerospace-grade SRAM-based FPGAs are vulnerable to single event effects causing soft errors.
• Increasing FPGA complexity exacerbates the challenge of correcting these soft errors.

Purpose of the Study:

• To propose soft error sensitivity analysis for FPGAs to enhance soft error repair efficiency.
• To review methods for analyzing soft error sensitivity in FPGA resources and configuration bitstreams.

Main Methods:

• Reviewing soft error sensitivity analysis methods for FPGA application layer resources.
• Reviewing soft error sensitivity analysis methods for FPGA configuration bitstreams.
• Discussing application layer memory scrubbing and configuration scrubbing techniques.

Main Results:

• Sensitivity analysis can identify critical areas in FPGAs susceptible to soft errors.
• Targeted scrubbing techniques based on sensitivity analysis improve error correction efficiency.
• Emerging technologies offer future directions for robust FPGA reliability.

Conclusions:

• Soft error sensitivity analysis is crucial for efficient soft error mitigation in FPGAs.
• Implementing targeted detection and correction strategies enhances the reliability of aerospace FPGAs.
• Continued research into novel mitigation technologies is vital for future space applications.