In situ Synchrotron X-ray Metrology Boosted by Automated Data Analysis for Real-time Monitoring of Cathode

Ruhil Dongol1, Arpan Mukherjee1, Jianming Bai2

  • 1Department of Materials Design and Innovation, University at Buffalo, Buffalo, NY, 14260, USA.

Small Methods
|September 9, 2024
PubMed
Summary

A new weighted lagged cross-correlation (WLCC) method analyzes synchrotron X-ray diffraction data in real-time. This enables rapid monitoring of battery material synthesis, improving quality control for cathode manufacturing.