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Yttrium-induced tunable bandgap for optical data storage applications.

Surbhi Agarwal1, D K Dwivedi1, Pooja Lohia2

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This study explores Te-based thin films for phase-change memory (PCM) applications. The investigated materials show promising optical and electronic properties for photonic devices.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Optoelectronics

Background:

  • Phase-change memory (PCM) is crucial for AI applications, requiring materials with high thermal stability and fast operation.
  • Current PCM materials face challenges in simultaneously achieving these critical performance characteristics.
  • Te-based chalcogenide materials are under investigation for advanced memory technologies.

Purpose of the Study:

  • To investigate the optical and electronic properties of Te(1-(GeSe0.5)Y (x = 0.05, 0.1, 0.15) thin films.
  • To evaluate their potential for photonic applications and artificial intelligence-inspired computing.
  • To understand the relationship between material composition and performance.

Main Methods:

  • Thin film deposition using thermal evaporation.
  • Structural characterization via X-ray diffraction (XRD).
  • Surface morphology analysis using Scanning Electron Microscopy (SEM).
  • Elemental composition analysis using Energy-Dispersive X-ray spectroscopy (EDX).
  • Optical property determination using UV-visible spectrophotometry (500–2500 nm).
  • Analysis of optical parameters including refractive index (n), extinction coefficient (k), absorption coefficient (α), and optical bandgap.
  • Application of Tauc's relationship and Urbach relation.
  • Calculation of nonlinear refractive index using the Wemple-DiDomenico model.
  • Determination of dielectric properties and energy loss functions.

Main Results:

  • The optical energy bandgap indicated allowed indirect transitions.
  • Enhanced optical parameters were observed with increasing Y content.
  • The refractive index, extinction coefficient, and absorption coefficient were systematically determined.
  • Nonlinear optical properties, dielectric properties, and energy loss functions were calculated.
  • Structural, morphological, and compositional analyses confirmed film integrity.

Conclusions:

  • The investigated Te-based thin films exhibit favorable optical and electronic properties.
  • The enhanced optical parameters suggest suitability for various photonic applications.
  • These materials show potential for use in advanced artificial intelligence hardware.