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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 3, 2026

Measurement of Dynamic Force Acted on Water Strider Leg Jumping Upward by the PVDF Film Sensor

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A material change for ultra-high precision force sensing.

Christopher Perrella^1,2, Kishan Dholakia^3,4,5

¹Centre of Light for Life and School of Biological Sciences, University of Adelaide, Adelaide, South Australia, 5005, Australia. chris.perrella@adelaide.edu.au.

Light, Science & Applications

|September 26, 2024

Summary

This summary is machine-generated.

A novel photonic force microscope was developed using a trapped lanthanide-doped crystal. This instrument achieves highly sensitive force detection, opening new avenues for physical science applications.

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Area of Science:

Optics and Photonics
Nanotechnology
Physical Sciences

Background:

Photonic force microscopy is a powerful technique for measuring minute forces.
Existing methods face limitations in sensitivity and resolution.
Nanoscale force sensing is crucial for various scientific disciplines.

Purpose of the Study:

To develop an original form of photonic force microscope.
To achieve unprecedented force sensitivity and detection limits.
To explore new prospects for force sensing in physical sciences.

Main Methods:

Development of a novel photonic force microscope.
Utilizing a trapped lanthanide-doped crystal of nanometric dimensions.
Implementing advanced optical trapping and detection techniques.

Main Results:

Achieved a minimum detected force of approximately 110 aN.
Demonstrated force sensitivity down to 1.8 fN/.
Successfully operated the microscope with nanoscale precision.

Conclusions:

The developed photonic force microscope represents a significant advancement in force sensing technology.
The high sensitivity and precision open new possibilities for research in physical sciences.
This technology has the potential to impact fields requiring nanoscale force measurements.