Related Experiment Video
Updated: Jun 11, 2025

13:58
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
11.7K
Silicon Carbide: Material Growth, Device Processing, and Applications
Marilena Vivona1, Mike Jennings2
1Institute for Microelectronics and Microsystems, National Research Council of Italy, 95121 Catania, Italy.
Materials (Basel, Switzerland)
|September 28, 2024
Abstract:
The continuous demand for electronic devices operating at increasing current and power levels, as well as at high temperatures and in harsh environments, has driven research into wide-band gap (WBG) semiconductors over the last three decades [...].

