Two-Step Contrast Source Learning Method for Electromagnetic Inverse Scattering Problems

Anran Si1, Miao Wang1, Fuping Fang1

  • 1College of Electronic Science and Technology, National University of Defense Technology, Changsha 410073, China.

Sensors (Basel, Switzerland)
|September 28, 2024
PubMed
Summary

This study introduces a novel two-step deep learning method for solving electromagnetic inverse scattering problems (EM-ISPs). The approach enhances accuracy and speed for real-time imaging, even with challenging high-contrast objects.

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