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Thermal characterization of vertical interface by scanning photothermal radiometry
Alejandro Mateos-Canseco1,2, Andrzej Kusiak1,2, Jean-Luc Battaglia1,2
1University Bordeaux, CNRS, Bordeaux INP, I2M, UMR 5295, F-33400 Talence, France.
The Review of Scientific Instruments
|October 4, 2024
Summary
Scanning photothermal radiometry effectively images submicron cracks. This method quantizes thermal properties and crack dimensions, offering precise material characterization for micro-defect analysis.
Area of Science:
- Materials Science
- Non-destructive Testing
- Thermal Analysis
Background:
- Micro-cracks pose significant risks in structural integrity.
- Accurate characterization of submicron defects is crucial for material reliability.
- Non-destructive evaluation techniques are essential for assessing material health.
Purpose of the Study:
- To image and characterize a submicron crack using scanning photothermal radiometry.
- To map the spatial evolution of the crack with micrometer resolution.
- To estimate the thermal boundary resistance and average thickness of a micro-crack interface.
Main Methods:
- Utilized scanning photothermal radiometry for thermal imaging.
- Modeled heat transfer in a semi-infinite vertical crack using the thermal quadrupole approach.
- Employed phase mapping for quantitative analysis of the crack interface.
Main Results:
- Successfully mapped the spatial evolution of a submicron crack.
- Estimated the equivalent thermal boundary resistance of the steel-steel interface.
- Determined the average interface thickness of the micro-crack, found to be less than 0.5 μm.
Conclusions:
- Scanning photothermal radiometry is a viable technique for submicron crack characterization.
- The thermal quadrupole model accurately represents heat transfer across the crack interface.
- Quantitative thermal property estimation is achievable for micro-scale defects.
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