Thermal characterization of vertical interface by scanning photothermal radiometry

Alejandro Mateos-Canseco1,2, Andrzej Kusiak1,2, Jean-Luc Battaglia1,2

  • 1University Bordeaux, CNRS, Bordeaux INP, I2M, UMR 5295, F-33400 Talence, France.

Summary

Scanning photothermal radiometry effectively images submicron cracks. This method quantizes thermal properties and crack dimensions, offering precise material characterization for micro-defect analysis.