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Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

Cryo-electron Microscopy

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...

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Related Experiment Video

Updated: Jun 11, 2025

Author Spotlight: Characterizing Porous Materials for Aiding the Development of Robust Metal-Organic Frameworks with Adsorption Behavior

Author Spotlight: Characterizing Porous Materials for Aiding the Development of Robust Metal-Organic Frameworks with Adsorption Behavior

Published on: March 8, 2024

Low-dose electron microscopy imaging for beam-sensitive metal-organic frameworks.

Yuhang Liang¹, Yi Zhou¹

¹School of Physical Science and Technology and Shanghai Key Laboratory of High-Resolution Electron Microscopy ShanghaiTech University Shanghai201210 People's Republic of China.

Journal of Applied Crystallography

|October 10, 2024

Summary

Advanced low-dose electron microscopy techniques enable detailed structural characterization of electron-beam sensitive metal-organic frameworks (MOFs). This review highlights recent progress in imaging MOF structures, defects, and guest molecules.

Keywords:

beam sensitive materials low-dose imaging metal–organic frameworks transmission electron microscopy

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A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks

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Last Updated: Jun 11, 2025

Author Spotlight: Characterizing Porous Materials for Aiding the Development of Robust Metal-Organic Frameworks with Adsorption Behavior

Author Spotlight: Characterizing Porous Materials for Aiding the Development of Robust Metal-Organic Frameworks with Adsorption Behavior

Published on: March 8, 2024

Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy

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Published on: August 15, 2014

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks

Published on: April 28, 2023

Area of Science:

Materials Science
Nanotechnology
Chemistry

Background:

Metal-organic frameworks (MOFs) possess exceptional properties, making their structural characterization crucial for material design and application.
Understanding the structure-property relationship in MOFs is key to their synthesis and utilization.
Scanning Transmission Electron Microscopy (STEM) is vital for nanoscale structural analysis, including periodic and aperiodic features.

Purpose of the Study:

To review recent advancements in low-dose high-resolution (S)TEM imaging for MOF characterization.
To discuss the application of these techniques in analyzing MOF framework structure, defects, and guest molecule distribution.
To explore emerging technologies and future research directions in MOF electron microscopy.

Main Methods:

Application of low-dose high-resolution (Scanning) Transmission Electron Microscopy ((S)TEM) for MOF structural analysis.
Utilizing advanced imaging techniques to overcome electron-beam sensitivity challenges in MOFs.
Review of emerging methods such as electron ptychography.

Main Results:

Successful characterization of MOF framework structures, including defects and surface/interface properties.
Detailed analysis of guest molecule distribution within MOF pores.
Demonstration of low-dose (S)TEM's capability to image beam-sensitive MOF materials without significant damage.

Conclusions:

Low-dose high-resolution (S)TEM is a powerful tool for elucidating MOF structures and properties.
Emerging techniques like electron ptychography offer new avenues for MOF investigation.
Continued development in electron microscopy will drive further discoveries in MOF science.