Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Fabrication of Terahertz Fresnel Zone Plates via Ultraprecision Mechanical Processing.

Micromachines·2026
Same author

Numerical Study of Quantifying Diffusion Effects on Deterministic Lateral Displacement at the Nanoscale.

Analytical chemistry·2026
Same author

Design and fabrication of an aluminium oxide cutting insert with an internal cooling channel.

Advances in manufacturing·2024
Same author

First-principles study of electron dynamics of MoS2 under femtosecond laser irradiation from deep ultraviolet to near-infrared wavelengths.

The Journal of chemical physics·2024
Same author

Study on magnetohydrodynamic internal cooling mechanism within an aluminium oxide cutting tool.

The International journal, advanced manufacturing technology·2024
Same author

Defect-Mediated Atomic Layer Etching Processes on Cl-Si(100): An Atomistic Insight.

The journal of physical chemistry. C, Nanomaterials and interfaces·2023
Same journal

RETRACTED: Zhang et al. A Novel Framework for Reconstruction and Imaging of Target Scattering Centers via Wide-Angle Incidence in Radar Networks. <i>Sensors</i> 2025, <i>25</i>, 6802.

Sensors (Basel, Switzerland)·2026
Same journal

Enhancing Unsupervised Multi-Source Domain Adaptation for Person Re-Identification via Mixture of Experts and Graph-Based Relation.

Sensors (Basel, Switzerland)·2026
Same journal

Development of an Instrumented Glove for Palmar Pressure Assessment in Kayakers.

Sensors (Basel, Switzerland)·2026
Same journal

Development and Experimental Validation of an Autonomous IoT-Based Monitoring System for Real-Time Water Quality Assessment in the Amazon River.

Sensors (Basel, Switzerland)·2026
Same journal

Semi-Supervised Adversarial Learning Framework for Controller Area Network Bus Intrusion Detection.

Sensors (Basel, Switzerland)·2026
Same journal

Smart Optimization Method for Safety Signs in Innovative Manufacturing Environments Integrating Industrial Field IoT Sensors and Knowledge Graphs.

Sensors (Basel, Switzerland)·2026
See all related articles

Related Experiment Video

Updated: Jun 21, 2026

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
11:44

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators

Published on: August 15, 2014

10.3K

Stereo Bi-Telecentric Phase-Measuring Deflectometry.

Yingmo Wang1, Fengzhou Fang1

  • 1State Key Laboratory of Precision Measuring Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin 300072, China.

Sensors (Basel, Switzerland)
|October 16, 2024
PubMed
Summary
This summary is machine-generated.

This study introduces a streamlined calibration method for bi-telecentric Phase-Measuring Deflectometry (PMD) systems. The new approach enhances measurement precision and efficiency by using a single flat mirror in three poses, simplifying the process.

Keywords:
deflectometrymeasurementsoptical sensors

More Related Videos

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.2K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.4K

Related Experiment Videos

Last Updated: Jun 21, 2026

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators
11:44

Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators

Published on: August 15, 2014

10.3K
Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.2K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

1.4K

Area of Science:

  • Optical Metrology
  • Computer Vision
  • Precision Engineering

Background:

  • Traditional Phase-Measuring Deflectometry (PMD) using endocentric lenses requires complex calibration.
  • Bi-telecentric lenses in PMD offer reduced distortion and improved accuracy but necessitate cumbersome extrinsic parameter calibration using micro-positioning stages.
  • Existing calibration methods for bi-telecentric PMD are time-consuming and limit flexibility.

Purpose of the Study:

  • To develop a simplified, flexible, and efficient calibration solution for stereo bi-telecentric Phase-Measuring Deflectometry (PMD).
  • To enhance measurement accuracy and precision in 3D surface metrology using bi-telecentric PMD.
  • To eliminate the need for micro-positioning stages in the calibration of bi-telecentric lenses.

Main Methods:

  • A novel calibration method utilizing only one flat mirror in three poses for stereo bi-telecentric PMD.
  • Employing calibration residuals to construct an inverse distortion map via bicubic Hermite interpolation for accurate anchor positioning.
  • Implementing a holistic and flexible calibration strategy to optimize extrinsic parameters.

Main Results:

  • Achieved a measurement accuracy of 3.5 μm (Peak-to-Valley) within a 100 mm × 100 mm × 200 mm volume.
  • Demonstrated reliable measurement results for various surfaces without restricting sample placement.
  • Significantly reduced calibration complexity and time compared to traditional methods.

Conclusions:

  • The proposed calibration method offers a robust and efficient solution for stereo bi-telecentric PMD systems.
  • The technique enhances measurement precision and accuracy, making it suitable for diverse surface metrology applications.
  • This approach simplifies the calibration process, increasing the practicality and accessibility of advanced optical metrology.