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Published on: January 16, 2019
Mode I Stress Intensity Factor Solutions for Cracks Emanating from a Semi-Ellipsoidal Pit
Hasan Saeed1, Robin Vancoillie1, Farid Mehri Sofiani1
1Soete Laboratory, Department of Electromechanical, Systems and Metal Engineering (EMSME), Faculty of Engineering and Architecture, Ghent University, Technologiepark 46, 9052 Zwijnaarde, Belgium.
This study investigates the Mode I stress intensity factor (KI) for cracks from semi-ellipsoidal pits. The crack-radius-to-pit-depth ratio (R/a) significantly influences KI, leading to a predictive model.
Area of Science:
- Solid Mechanics
- Fracture Mechanics
- Computational Engineering
Background:
- Stress intensity factor (SIF) is crucial in linear elastic fracture mechanics for predicting fatigue crack growth.
- Existing literature lacks SIF solutions for cracks originating from 3D semi-ellipsoidal pits.
Purpose of the Study:
- To conduct a comprehensive parametric investigation of Mode I stress intensity factor (KI) for cracks emanating from semi-ellipsoidal pits.
- To analyze the influence of pit geometry and crack dimensions on KI.
- To develop a predictive model for KI.
Main Methods:
- Finite element analysis (FEA) simulations controlled by Python scripts.
- Calculation of KI using the displacement extrapolation method.
- Parametric study involving normalized geometric parameters: a/2c, a/t, and R/a.
- Development of a predictive model using k-d tree and k-NN algorithms based on 216 FEA simulations.
Main Results:
- Identified the significant effect of normalized geometric parameters on KI.
- Determined that the crack-radius-to-pit-depth ratio (R/a) is the dominating parameter influencing KI.
- Successfully incorporated FEA data into a predictive model.
Conclusions:
- The R/a ratio is the primary geometric factor governing KI for cracks from semi-ellipsoidal pits.
- The developed k-NN predictive model offers a valuable tool for estimating KI in such configurations.
- This research addresses a gap in SIF solutions for complex 3D pit geometries.
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