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Updated: Jun 10, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
1Qualcomm Institute, University of California San Diego, 9500 Gilman Dr, La Jolla, CA, 92093, USA. agrieco@ucsd.edu.
Abstract:
A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss, phase response, and dispersion properties over a broad bandwidth, with high resolution and dynamic range.
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