Morphology Determination of Luminescent Carbon Nanotubes by Analytical Super-Resolution Microscopy Approaches

The ability to determine the precise structure of nano-objects is essential for a multitude of applications. This is particularly true of single-walled carbon nanotubes (SWCNTs), which are produced as heterogeneous samples. Current techniques used for their characterization require sophisticated instrumentation, such as atomic force microscopy (AFM), or compromise on accuracy. In this paper, we propose to use super-resolution microscopy (SRM) to accurately determine the morphology (orientation, length, and shape) of individual luminescent SWCNTs. We generate super-resolved images using three recently published SRM analytical software packages (DPR, eSRRF, and MSSR) and metrologically compare their performances to determine the morphological properties of SWCNTs. For this, ground-truth information on nanotube morphologies was obtained using polarization measurements and AFM to directly correlate the results from SRM at the single particle level. We show a more than 4-fold improvement in resolution over standard photoluminescence imaging, revealing hidden morphologies as efficiently as AFM. We finally demonstrate that DPR, and eventually eSRRF, can effectively assess SWCNT length distribution in a much faster and more accessible way than AFM. We believe that this approach can be generalized to other types of luminescent nanostructures and thus become a standard for rapid and accurate characterization of samples.