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Quality-related fault detection for dynamic process based on quality-driven long short-term memory network and
Yishun Liu1, Keke Huang1, Benedict Jun Ma2
1School of Automation, Central South University, Changsha 410083, China.
This study introduces a novel fault detection method using quality-driven long short-term memory and autoencoder (QLSTM-AE) for industrial processes. The QLSTM-AE accurately identifies faults and distinguishes quality-related issues, improving efficiency and reducing losses.
Area of Science:
- Industrial Process Monitoring
- Machine Learning for Fault Detection
- Data Analytics in Manufacturing
Background:
- Industrial dynamic processes are complex, making fault detection challenging.
- Distinguishing quality-related faults is difficult, leading to losses.
- Existing methods struggle with uneven dynamics and feature extraction.
Purpose of the Study:
- To develop a novel fault detection method for complex industrial dynamic processes.
- To improve the accuracy of fault detection by incorporating quality variables.
- To effectively distinguish between different types of faults, including quality-related ones.
Main Methods:
- Utilized a quality-driven long short-term memory and autoencoder (QLSTM-AE) model.
- Employed a long short-term memory (LSTM) network for dynamic feature extraction.
- Incorporated quality variables in parallel and used reconstruction error (SPE) and Hotelling T² (H²) statistics for fault detection.
Main Results:
- The QLSTM-AE method demonstrated high accuracy in fault detection.
- The proposed strategy effectively distinguished between various fault types.
- Experiments on simulations and the Tennessee Eastman (TE) benchmark confirmed the method's reliability and effectiveness.
Conclusions:
- The QLSTM-AE method offers a reliable and accurate approach to fault detection in industrial dynamic processes.
- It successfully addresses challenges related to complex dynamics and quality-related fault identification.
- The method outperforms existing state-of-the-art techniques in accuracy and fault separation.
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