A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental...

Atomic Force Microscopy (AFM) is a leading nanoscale technique known for its significant advantages in the analysis of soft materials and biological samples. Traditional AFM data analysis is often based on the Hertz model, which assumes perpendicular indentation of a planar sample. However, this assumption is not always valid due to the varying geometries of soft materials, whether natural, synthetic or biological. In this study, we present a new theoretical model that incorporates correction coefficients into Hertz's model to account for cone-like and spherical probes, and to consider local tilt at the probe-sample interface. We validate our model using finite element analysis (FEA) simulations and experimental AFM measurements on tilted polyacrylamide gels. Our results highlight the need to include local tilt at the probe-sample contact to ensure accurate AFM measurements. This represents a step forward in our understanding of the elastic properties at the surface of soft materials in the broadest sense.