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Lifetime mapping using femtosecond time-resolved photoemission electron microscopy
Norman Tze Wei Koo1, Kyung Chul Woo1, Justin Wei Xiang Lim2
1School of Chemistry, Chemical Engineering and Biotechnology, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore.
The Journal of Chemical Physics
|November 1, 2024
Summary
This study introduces a new method for creating lifetime maps using time-resolved photoemission electron microscopy (PEEM). This technique enhances the analysis of ultrafast electron dynamics in materials with nanoscale precision.
Area of Science:
- Materials Science
- Surface Science
- Spectroscopy
Background:
- Time-resolved photoemission electron microscopy (PEEM) is crucial for studying ultrafast electron dynamics at the nanoscale.
- Pixel-by-pixel lifetime mapping using PEEM has been a missing capability for detailed material characterization.
Purpose of the Study:
- To develop and validate a method for pixel-by-pixel lifetime mapping using PEEM.
- To enable the correlation of material microenvironments with ultrafast electronic processes.
Main Methods:
- Detailed data pre-processing procedures for time-resolved PEEM data.
- Development of an algorithm for time-trace fitting at each pixel.
- Implementation of an energy cutoff before spectral integration to improve data robustness.
Main Results:
- The energy cutoff significantly improves the statistics and reduces fitting errors in time-trace analysis.
- Accurate determination of fit parameters, including decay time constants, is achieved.
- Reliable construction of PEEM-based lifetime maps is now possible.
Conclusions:
- The developed method enables reliable PEEM-based lifetime mapping.
- This technique facilitates the study of local microenvironment effects on ultrafast dynamics.
- Lifetime maps can be correlated with other microscopic techniques for comprehensive material characterization.
