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Te L-subshell x-ray emission induced by lower energy H2+ ions
Jing Wei1, Xianming Zhou2,3, Rui Cheng4
1Ion Beam and Optical Physics Joint Laboratory of Xianyang Normal University and IMP, CAS, Xianyang Normal University, Wenlin Rd. 01, Xianyang, 712000, Shannxi, China.
Abstract:
The L-shell x-ray emission of tellurium induced by H2+ ions impact is investigated in an energy range of 150-300 keV. The blue shifts of various L-subshell x rays and the enhancement of the relative intensity ratios of Lι, Lβ to Lα x ray are observed and interpreted by the multiple ionization of outer-shell electrons. The new experimental x-ray production cross sections, which almost correspond to those of protons with half of the original energy, are extracted and compared with various theoretical estimations. The correction effects of the united atom approximation and the multiple ionization atomic parameters are compared, and the influence of atomic parameters from different databases on the simulations is discussed. Overall, the ECUSAR-MI calculations using theoretical atomic parameters present the best agreement with the experiment results.
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