Related Experiment Video
Updated: Jun 5, 2025

Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging
Published on: September 8, 2017
Flat lens-based subwavelength focusing and scanning enabled by Fourier translation
Xin Zhang1,2, Yanwen Hu1,2,3, Haolin Lin1,2
1College of Physics and Optoelectronic Engineering, Jinan University, Guangzhou 510632, China.
Abstract:
We demonstrate a technique for flexibly controlling subwavelength focusing and scanning, by using the Fourier translation property of a topology-preserved flat lens. The Fourier transform property of the flat lens enables converting an initial phase shift of light into a spatial displacement of its focus. The flat lens used in the technique exhibits a numerical aperture of 0.7, leading to focusing the incident light to a subwavelength scale. Based on the technique, we realize flexible control of the focal positions with arbitrary incident light, including higher-order structured light. Particularly, the presented platform can generate multifocal spots carrying optical angular momentum, with each focal spot independently controlled by the incident phase shift. This technique results in a scanning area of 10 μm × 10 μm, allowing to realize optical scanning imaging with spatial resolution up to 700 nm. This idea is able to achieve even smaller spatial resolution when using higher-numerical-aperture flat lens and can be extended to integrated scenarios with smaller dimension. The presented technique benefits potential applications such as in scanning imaging, optical manipulation, and laser lithography.
Related Concept Videos
Confocal Fluorescence Microscopy
Super-resolution Fluorescence Microscopy
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Focusing of Light in the Eye

