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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Tao Hou1, Sicen Tao1, Haoran Mu2
1Department of Physics and Institute of Electromagnetics and Acoustics, Xiamen University, Xiamen 361005, China.
A novel invisibility concentrator using van der Waals materials offers cloaking and energy focusing. This design, utilizing molybdenum trioxide, simplifies experimental realization for advanced optical devices.
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