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Updated: Jun 5, 2025

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Published on: June 19, 2018
Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline
Zhisen Jiang1, Hui Jiang1, Yinghua He1
1Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, 239 Zhangheng Road, Pudong District, Shanghai 201204, People's Republic of China.
Abstract:
A novel dual-frequency real-time feedback system has been developed to simultaneously optimize and stabilize beam position and energy at the hard X-ray nanoprobe beamline of the Shanghai Synchrotron Radiation Facility. A user-selected cut-off frequency is used to separate the beam position signal obtained from an X-ray beam position monitor into two parts, i.e. high-frequency and low-frequency components. They can be real-time corrected and optimized by two different optical components, one chromatic and the other achromatic, of very different inertial mass, such as Bragg monochromator dispersive elements and a pre-focusing total external reflection mirror. The experimental results shown in this article demonstrate a significant improvement in position and energy stabilities. The long-term beam angular stability clearly improved from 2.21 to 0.92 µrad RMS in the horizontal direction and from 0.72 to 0.10 µrad RMS in the vertical direction.
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