Fractional-Order Identification of Gyroscope MEMS Noise Under Various Temperature Conditions

This paper deals with identifying the fractional-order noise parameters for MEMS gyroscopes under various temperature conditions. The significant contribution of the paper is to investigate the relation between the fractional noise model of MEMS devices and different ambient temperatures. In our paper, variance, correlation, and introduced estimation analysis methods have been meticulously applied to determine noise parameters with fractional-order dynamics. Experimental data were collected precisely under various ambient temperatures, while the MEMS device was located in a climate chamber. The origin of the paper is motivated by a project entitled "Family of optoelectronic heads for guided missiles-SEEKER", where the IMU sensor is a crucial electronic device used to measure the angular velocity of the optoelectronic head. It is widely known that the IMU measurements built-in MEMS technology often come with a random walk, as well as biases and noises affecting the final results.