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Unified Multi-Abstraction-Level Functional Testing and Performance Measurements for Industrial IoT in Spatially
Jubin Sebastian E1, Fabian Sowieja1, Axel Sikora1
1Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University of Applied Sciences, 77652 Offenburg, Germany.
This study introduces a unified testing methodology for Narrow Band-Wireless Wide Area Networking (NB-WWAN) technologies. It addresses challenges in device and network testing for reliable, long-range wireless connectivity.
Area of Science:
- Wireless Communication Engineering
- Network Testing and Performance Analysis
- Internet of Things (IoT) Infrastructure
Background:
- Narrow Band-Wireless Wide Area Networking (NB-WWAN) offers reliable, long-range connectivity with low power consumption, driving its adoption in diverse applications.
- Existing NB-WWAN testing faces challenges at device (resource limits, protocols) and network (topology, signal propagation) levels.
- Consistent, systematic performance evaluation across development phases is crucial for NB-WWAN systems.
Purpose of the Study:
- To propose a unified multi-abstraction-level testing methodology for NB-WWAN technologies.
- To address the complexities in functional testing and performance assessment of NB-WWAN systems.
- To enable systematic and consistent evaluation of NB-WWAN performance across different development stages.
Main Methods:
- Development of a unified testing methodology applicable across multiple abstraction levels.
- Implementation of a prototype system for evaluating the proposed methodology.
- Testing across network simulators, emulated lab testbeds, and real-world field test environments.
Main Results:
- The proposed methodology provides a systematic approach to overcome NB-WWAN testing challenges.
- Comprehensive evaluation of NB-WWAN technologies is achieved through multi-abstraction-level testing.
- The prototype implementation demonstrates the feasibility and effectiveness of the unified testing approach.
Conclusions:
- A unified multi-abstraction-level testing methodology is essential for robust NB-WWAN evaluation.
- The developed approach facilitates seamless testing and consistent performance comparison.
- This methodology supports the reliable deployment and optimization of NB-WWAN technologies.
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