Unified Multi-Abstraction-Level Functional Testing and Performance Measurements for Industrial IoT in Spatially

Jubin Sebastian E1, Fabian Sowieja1, Axel Sikora1

  • 1Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University of Applied Sciences, 77652 Offenburg, Germany.

PubMed
Summary

This study introduces a unified testing methodology for Narrow Band-Wireless Wide Area Networking (NB-WWAN) technologies. It addresses challenges in device and network testing for reliable, long-range wireless connectivity.

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