Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography...

Area of Science:

• Materials Science
• Crystallography
• Condensed Matter Physics

Background:

• Disorder in crystalline and amorphous materials like glass presents challenges for structural analysis.
• Element-specific analysis with atomic resolution is crucial for understanding material properties.

Purpose of the Study:

• To develop a novel diffractometer combining X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS).
• To enable element-specific structural analysis with atomic resolution for crystalline and amorphous materials.
• To determine crystal orientation using integrated diffractometry.

Main Methods:

• Utilized a carry-in diffractometer with synchrotron X-ray source for tunable wavelengths.
• Integrated XFH and anomalous X-ray scattering (AXS) configurations.
• Employed a standing wave in a hologram for XFH on crystals with blurred emission lines.
• Used three multi-array detectors with crystal analyzers for high-throughput AXS.

Main Results:

• Achieved element-specific analysis with atomic resolution for disordered materials.
• Successfully determined crystal orientation via diffractometry.
• Enabled XFH for crystals with blurred emission lines.
• Obtained high-throughput AXS with sufficient count statistics and energy resolution.

Conclusions:

• The developed diffractometer enhances the scope of tractable targets for XFH and AXS.
• The instrument provides novel functionalities for advanced materials characterization.
• This advancement facilitates deeper understanding of atomic-level disorder in various materials.