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Point-spread-function engineering in MINFLUX: optimality of donut and half-moon excitation patterns.

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    Researchers optimized excitation patterns for Maximally INFormative LUminescence eXcitation (MINFLUX) super-resolution microscopy. New half-moon beams nearly double localization precision, surpassing conventional donut beams.

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    Area of Science:

    • Optics and Photonics
    • Biophysics
    • Microscopy

    Background:

    • Localization microscopy breaks the optical diffraction limit for super-resolution imaging.
    • Maximally INFormative LUminescence eXcitation (MINFLUX) enhances resolution by optimizing excitation point spread function (PSF) and minimizing photon flux.
    • The optimality of various proposed MINFLUX beam shapes for localization efficiency is not well-established.

    Purpose of the Study:

    • To determine optimal excitation patterns for MINFLUX super-resolution microscopy using a numerical and theoretical framework.
    • To computationally search for novel beam patterns, reducing the need for costly experimental exploration.
    • To evaluate the performance of new beam patterns against conventional methods.

    Main Methods:

    • Development of a numerical and theoretical framework for analyzing MINFLUX excitation patterns.
    • Computational search for optimal beam shapes to maximize localization precision.
    • Comparison of theoretical localization precision for different beam patterns, including donut and novel half-moon shapes.

    Main Results:

    • The conventional donut beam is identified as a robust optimum when all excitation beams share the same shape.
    • A novel PSF engineering framework identified two pairs of orthogonal half-moon beams.
    • These new half-moon beams theoretically improve localization precision by approximately a factor of two.

    Conclusions:

    • The study provides a computational approach for discovering optimal MINFLUX excitation patterns.
    • Novel half-moon beams offer a significant advancement in MINFLUX super-resolution imaging, nearly doubling localization precision.
    • This work paves the way for more efficient and precise super-resolution microscopy techniques.