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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Haowen Shen1, Wenyong Zhou2, Jinye Wang1
1Innovation Center for Electronic Design Automation Technology, Hangzhou Dianzi University, Hangzhou 310018, China.
This study presents a new method combining artificial neural networks (ANNs) and Particle Swarm Optimization (PSO) for efficient parameter optimization of Gallium Nitride High Electron Mobility Transistor (GaN HEMT) devices. The ANN-PSO approach improves automation and accuracy in device modeling.
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