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Published on: February 4, 2018
Design and Testing of MEMS Component for Electromagnetic Pulse Protection
Shiyi Li1,2,3, Hengzhen Feng1,3, Wenzhong Lou1,2,3
1School of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, China.
Abstract:
With the demand for high-safety, high-integration, and lightweight micro- and nano-electronic components, an MEMS electromagnetic energy-releasing component was innovatively designed based on the corona discharge theory. The device subverted the traditional device-level protection method for electromagnetic energy, realizing the innovation of adding a complex circuit system to the integrated chip through micro-nanometer processing technology and enhancing the chip's size from the centimeter level to the micron level. In this paper, the working performance of the MEMS electromagnetic energy-releasing component was verified through a combination of a simulation, a static experiment, and a dynamic test, and a characterization test of the tested MEMS electromagnetic energy-releasing component was carried out to thoroughly analyze the effect of the MEMS electromagnetic energy-releasing component. The results showed that after the strong electromagnetic pulse injection, the pulse breakdown voltage of the MEMS electromagnetic energy-releasing component increased exponentially in terms of the pulse injection voltage, and the residual pulse current decreased significantly from one-third to one-half of the original, representing a significant protective effect. In a DC environment, the breakdown voltage of the needle-needle structure of the MEMS electromagnetic energy-releasing component was 144 V, and the on-time was about 0.5 ms.

