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Updated: Jun 1, 2025

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
First-principles study of anisotropic planar 2D BC2N for sub-5 nm high-performance p-type transistors
Hao Shi1, Siyu Yang1, Jialin Yang1
1MIIT Key Laboratory of Advanced Display Materials and Devices, College of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China. 52023190@njust.edu.cn.
Abstract:
Two-dimensional (2D) materials are considered the potential channel for next-generation transistors. Unfortunately, the development of p-type 2D material transistors lags significantly behind that of n-type, thereby impeding the advancement of complementary logical circuits. In this study, we investigated the electronic properties of 2D BC2N and analyzed the transport performance of p-type 2D BC2N-6 FETs through first-principles calculations. The anisotropic electronic properties of BC2N-6 led to variations in device transport performance along the zigzag and armchair directions. The on-state current of 10 nm BC2N-6 FETs could reach 2415 μA μm-1 and 1660 μA μm-1 along the zigzag and armchair directions, respectively. Subthreshold swing (SS) values for both directions were 63 mV dec-1, nearing the limit of 60 mV dec-1. Even when the gate length was scaled down to 5 nm, the on-state current of BC2N-6 FETs in both directions exceeded 1500 μA μm-1, which was approximately 160% of International Technology Roadmap for Semiconductors (ITRS) standards for high-performance (HP) devices. Furthermore, the delay time (τ) and power dissipation (PDP) of BC2N-6 FETs could fully satisfy ITRS requirements. Our work demonstrates that monolayer BC2N-6 can serve as a competitive p-type channel for next-generation devices.
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