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Updated: May 31, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Miniaturized inertial sensor based on high-resolution dual atom interferometry
Si-Bin Lu1, Jia-Hao Fu1,2, Min Jiang1
1State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan 430071, China.
Abstract:
Atom interferometry shows high sensitivity for inertial measurements in the laboratory, but it faces difficulties in field applications because of a trade-off between sensitivity and size. Therefore, there is an urgent need to develop a small sensor with high resolution for measuring acceleration and rotation in inertial navigation applications. Presented here is a miniaturized inertial sensor capable of measuring acceleration and rotation simultaneously based on high-resolution dual atom interferometers. A sensor head is integrated within a volume of 100 l, in which the vacuum chambers are fabricated by bonding quartz-glass windows with epoxy resin. A photoelectric cabinet is composed of four 3U rack units by integrating optical modules and electronic units. Dual atom interference fringes with a contrast of 29% are observed, and the acceleration and rotation are measured simultaneously by extracting their phase shifts. By developing a temperature compensation method to eliminate phase drifts caused by the thermal deformation of the Raman mirrors and using wave vector reversal to eliminate the phase drifts independent of the direction of the wave vector, measurement resolutions of 40 ng at 518 s and 6.1 nrad/s at 10 880 s are achieved for acceleration and rotation, respectively, from Allan deviations.
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