Related Experiment Video
Updated: May 30, 2025

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
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Correction to "Fermi Level Pinning at Electrical Metal Contacts of Monolayer Molybdenum Dichalcogenides"
ACS Nano
|January 25, 2025
Abstract
No abstract available in PubMed .
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