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Updated: May 30, 2025

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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
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Atomic-scale Control of Tunneling in Donor-based Devices
Xiqiao Wang1,2,3, Jonathan Wyrick1, Ranjit V Kashid1
1National Institute of Standards and Technology, 100 Bureau Dr., Gaithersburg, Maryland 20899, USA.
Summary
Researchers achieved atomic-scale control over tunneling rates in donor-based quantum devices. This breakthrough in fabrication paves the way for advanced solid-state quantum computing and simulations.
Area of Science:
- Quantum computing
- Solid-state physics
- Materials science
Background:
- Atomically precise donor-based quantum devices offer potential for quantum computing and simulations.
- Challenges in fabrication have hindered atomic-scale control of tunneling rates and coupling.
Purpose of the Study:
- To demonstrate systematic, atomic-scale control over tunneling rates in quantum devices.
- To establish a reproducible fabrication process for precision-patterned single electron transistors.
Main Methods:
- Utilized a room-temperature grown locking layer and precise fabrication control.
- Employed scanning tunneling microscopy (STM) for atomic-scale patterning.
- Used Si(100)2×1 surface reconstruction as a ruler to characterize the tunnel gap.
Main Results:
- Achieved high-quality epitaxy and reduced unintentional dopant movement.
- Demonstrated exponential scaling of tunneling resistance with tunnel gap size (7-16 dimer rows).
- Showcased reproducible device patterning with atomic precision.
Conclusions:
- Established a donor-based fabrication process with atomic precision.
- Confirmed that atomic-scale changes in the tunnel gap predictably alter tunneling rates.
- Advanced the development of atomically precise quantum devices for future applications.
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