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Updated: May 30, 2025

06:46
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
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Multispectral Schwarzschild imaging system for the extreme ultraviolet emission measurement of tokamak plasma:
Optics Express
|January 29, 2025
Abstract:
This erratum corrects the affiliation addresses of authors of our paper [Opt. Express32, 43748 (2024).10.1364/OE.545563].
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