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Predicting Perovskite Photovoltaics Performance
Emily Amonette1, Kshitiz Dolia1, Yanfa Yan1
1Department of Physics and Astronomy & Wright Center for Photovoltaic Innovation and Commercialization, The University of Toledo, Toledo, Ohio 43606, United States.
ACS Applied Materials & Interfaces
|January 29, 2025
Summary
Spectroscopic ellipsometry accurately predicts perovskite photovoltaic (PV) device performance by analyzing optical and structural properties. This method improves simulation accuracy, reducing overestimations in key performance parameters.
Area of Science:
- Materials Science
- Renewable Energy
- Optoelectronics
Background:
- Perovskite solar cells offer promising photovoltaic (PV) performance.
- Accurate prediction of PV device parameters is crucial for development and manufacturing.
- Current simulation methods often overestimate device performance, limiting their practical utility.
Purpose of the Study:
- To determine the complex optical and structural properties of perovskite layers using spectroscopic ellipsometry.
- To simulate external quantum efficiency (EQE) spectra and predict PV device performance parameters.
- To develop strategies for enhancing the accuracy of PV device performance predictions.
Main Methods:
- Spectroscopic ellipsometry was employed in a through-the-glass configuration on complete PV devices.
- Mapping spectroscopic ellipsometry measurements were performed on incomplete device stacks from the perovskite film side.
- Optical properties, structural properties, layer thicknesses, perovskite band gap, and Urbach energies were analyzed.
Main Results:
- Simulations based on incomplete device measurements showed inaccuracies due to exposed perovskite film characteristics differing from protected ones.
- Predictions for PV performance parameters achieved within 5% accuracy for three out of four baseline devices.
- Spectroscopic ellipsometry provides valuable data for predicting PV device performance, especially when experimental measurements are challenging.
Conclusions:
- Spectroscopic ellipsometry is a powerful tool for characterizing perovskite PV devices and predicting their performance.
- Accounting for the differences between exposed and protected perovskite films is essential for accurate simulations.
- This approach offers a viable alternative for performance evaluation during device development and production.
