Atomic Force Microscopy
Overview of Microscopy Techniques
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Updated: May 28, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Matilde Gelli1, Bruno Tiribilli2, Faiza Abdul Salam3
1Department of Information Engineering, University of Florence, 50139 Florence, Italy.
This study introduces an adaptive driving strategy to reduce parachuting artifacts in Atomic Force Microscopy (AFM) imaging. The new method enhances nanoscale imaging quality by minimizing topographical errors, especially at faster scanning speeds.
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