Simulation and Analysis of Imaging Process of Phosphor Screens for X-Ray Imaging of Streak Tube Using Geant4-Based...

Ultrafast diagnostic technology has caused breakthroughs in fields such as inertial confinement fusion, particle accelerator research, and laser-induced phenomena. As the most widely used tool for ultrafast diagnostic technology, investigating the characteristics of streak cameras in the imaging process and streak tubes' complex physical processes is significant for its overall development. In this work, the imaging process of a streak camera is modeled and simulated using Geant4-based Monte Carlo simulations. Based on the selected phosphor screen P43 (Gd₂O₂S: Tb) and charged coupled device (CCD) sensor parameters, Monte Carlo simulation models of phosphor screens and CCD sensors (We refer to the sensor parameters of the US company onsemi's KAF-50100 sensor, but some adjustments are made during the simulation), implemented with the toolkit Geant4, are used to study the electron beam to generate fluorescence on phosphor and photoelectrons on CCD sensors. The physical process of a high-energy electron beam hitting a phosphor screen and imaging on the CCD camera is studied. Meanwhile, merits such as the luminous efficiency of the selected phosphor, spatial resolution of the phosphor screen, and spatial resolution of the selected CCD sensor are analyzed. The simulation results show that the phosphor screen and CCD sensor simulation models can accurately simulate the selected components' performance parameters with the imaging process' simulation results precisely reflecting the distribution of output electrons in the streak image tube. References for simulation and device selection in the subsequent research on streak cameras can be provided.