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IR Spectrometers

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Design And Calibration Of A Slit Light Source For Infrared Deflectometry.

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Design And Calibration Of A Slit Light Source For Infrared Deflectometry.

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Design and Calibration of a Slit Light Source for Infrared Deflectometry.

Lu Ye^1,2, Xiangchao Zhang¹, Min Xu¹

¹Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, China.

Sensors (Basel, Switzerland)

|February 13, 2025

View abstract on PubMed

Summary

This summary is machine-generated.

A novel infrared slit light source improves curved surface measurement accuracy to 1 µm RMS. This cost-effective tool enhances surface quality assessment in optical workshops.

Keywords:

aspherical surface camera calibration grinding infrared deflectometry optical measurement

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Area of Science:

Optics and Photonics
Metrology and Measurement Science

Background:

Infrared deflectometry is crucial for measuring precision-engineered curved surfaces.
The performance of infrared deflectometry heavily relies on the infrared light source's properties and configuration.

Purpose of the Study:

To design and validate a stable, uniform infrared slit light source for enhanced deflectometry.
To develop a calibration method for infrared cameras using the designed light source.

Main Methods:

A cavity structure utilizing a polyimide heating film was employed to create the infrared slit light source.
Alignment was performed using a theodolite and cubic prism to minimize positional deviations during scanning.
The light source was also utilized as a calibration board for infrared cameras.

Main Results:

The designed infrared slit light source demonstrated good stability and uniformity, reducing background noise.
The integrated system achieved a measurement accuracy of 1 µm Root Mean Square (RMS).
The method proved effective for rapid measurements in grinding processes.

Conclusions:

The developed infrared slit light source and calibration method offer a reliable, cost-effective, and efficient solution for surface quality assessment.
This technology has significant application potential in optical workshops for precision surface metrology.