Related Experiment Video
Updated: May 28, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Design and Calibration of a Slit Light Source for Infrared Deflectometry
Lu Ye1,2, Xiangchao Zhang1, Min Xu1
1Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, China.
Abstract:
Infrared deflectometry is an efficient and accurate measuring method for curved surfaces fabricated via grinding or finish milling. The emitting properties and geometrical configurations of the infrared light source is a core component governing the measurement performance. In this paper, an infrared slit light source is designed based on the cavity structure of a polyimide heating film. This design ensures good stability and uniformity of the light source whilst effectively reducing background noise. Additionally, the light source can be applied as a calibration board for calibrating infrared cameras. The light source is aligned using a theodolite and cubic prism to control the positional deviations during scanning. Experimental results demonstrate that the proposed slit light source and calibration method can achieve a measurement accuracy of 1 µm RMS, which can meet the needs of rapid measurement in grinding. This approach provides a reliable, cost-effective, and efficient tool for surface quality assessments in optical workshops and has a broad application potential.

