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Published on: November 11, 2022
Jiayang Shi1, Daniël M Pelt1, K Joost Batenburg1
1Leiden University, Einsteinweg 55, 2333 CC Leiden, The Netherlands.
This study introduces a novel deep learning method to reduce artifacts in synchrotron computed tomography (CT) imaging. By applying tailored models at each pipeline stage, it significantly enhances image quality and outperforms existing techniques.
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